XMCD microspectroscopy at the spin-reorientation transition of ultrathin Ni films

   Using a photoelectron emission microscope as a laterally resolving detector for x-ray magnetic circular dichroism (XMCD) spectroscopy, local absorption spectra with microscopic resolution can be obtained. These can be analyzed by the so-called sum rules to extract quantitative information about spin and orbital magnetic moments.

   The images show the result of such a microspectroscopic study of a Co/Ni crossed wedge on Cu(001). The Ni thickness increases from left to right, as indicated at the top axes, the Co overlayer thickness from bottom to top, as indicated at the right axes.



   The left hand side shows a microscopic image of the distribution of the Ni spin moment, projected onto the light incidence direction (from bottom to top). On the right hand side, the corresponding distribution of the Ni orbital moment is shown. The legends at the bottom of each figure explain the color code used. 76800 separate XMCD spectra, one for each image pixel, have been analyzed to construct these images.

   The dotted line in the images marks a spin reorientation transition in the bilayer. It separates a region with out-of-plane magnetization in the lower part of the images from a region with in-plane magnetization in the upper part. This spin reorientation transition occurs as a function of both the Ni and Co thicknesses.

   An analysis of the orbital to spin moment ratio as a function of lateral distance from the spin reorientation line is shown in the next figure. The data points were obtained by averaging along lines of one image pixel width, parallel to the spin reorientation transition. The left hand side (negative distances, red) corresponds to the upper part of the images, where in-plane magnetization is present, the right hand side (positive distances, blue) to the lower part of the images, where out-of-plane magnetization is present. A distinct change in the ratio of orbital to spin moment across the spin reorientation transition is clearly seen. It is attributed to the magnetic anisotropy of the Ni layer, which is forced along its hard in-plane directions by the presence of the Co overlayer in the top part of the images.


   This correlation between magnetic anisotropy and orbital magnetic moment makes XMCD microspectroscopy a powerful tool for the microscopic element-resolved investigation of magnetic anisotropies.

   These studies were performed at SPring-8 in Japan in collaboration with S. Imada and S. Suga, Osaka University.

Publication: Physical Review B 62, 3824 (2000).

Related Publications:
Journal of Applied Physics 87, 5747 (2000),

Journal of Electron Spectroscopy and Related Phenomena 109, 249 (2000),

Surface Science 480, 153 (2001),

Surface Review and Letters 9, 877 (2002).